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Àåºñ¸í(¾à¾î) Atomic Force Microscope (AFM)
¸ðµ¨¸í XE-100
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À§Ä¡ FTC 205È£
´ã´çÀÚ ÃÖÁö¿ø jieun03@hanyang.ac.kr
´ã´çÀÚ ÀüÈ­¹øÈ£ 02-2220-1349
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1. Scanner

1) Scan range of XY scanners: 5 µm, 40 µm,

2) Scan range of Z scanners: 12 µm or 25 µm

 

2. Stage

1) Working range of XY stage : 25 mm ¡¿ 25 mm, manual precision movement

2) Working range of Z stage : 27.5 mm, motorized movement

3) Measureable sample size : 80 mm ¡¿ 80 mm, 20 mm thick, and up to 500 g

 

3. Head

1) Detection of cantilever deflection

- Laser Diode : 650 nm

 

4. Vision

1) On-axis vision of sample surface and cantilever

- Focus range : 20 mm, motorized

- Magnification: 780¡¿ ( optional 160¡¿, 390¡¿ )

- Field of view: 480 µm ¡¿ 360 µm

- Optical resolution: 1 µm

 

5. Vision

1) Electronics

- Maximum image size : 512 pixels

 

6. Software

1) XEI : AFM data analysis software (running on Windows, MacOS X, and Linux)

 

7. Supporting Mode

1) True Non-Contact Mode

2) Contact mode

 

8. Accessory

1) SPM Microscope Stage, Head and Scanner

2) Phase Imaging (Phase Detection Microscopy)

3) Lateral Force Microscopy and Topography can be measured simultaneously)

      - Operating Mode : Contact AFM

4) Magnetic Force Microscopy and Magnetic Field Generator

- True non-contact imaging, simultaneous topography and MFM

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20,000¿ø/½Ã·á, 30ºÐ´ç30,000¿ø